Defacto was at ITC Fort Worth

With nowadays System on Chips and the emerging market segments such for Automotive, Testability and safety requirements are more and more challenging for the design community. Designing complex DFT architectures after synthesis is no longer possible.


This year, Defacto will be demonstrating the first platform which helps exploring complex DFT architectures when combining different DFT methodologies:

  • Test compression
  • Scan
  • Memory planning (MBIST)
  • Etc.


Defacto team will be showcasing an advanced automated design solution for Early DFT Exploration and Planning. Please visit us at the Fort Worth TX Convention Center, booth #403. An in-depth technical presentation is provided on November 15 at 1.40PM .